The association between null mutations in the filaggrin gene and contact sensitization to nickel and other chemicals in the general population

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningfagfællebedømt

It was recently shown that filaggrin gene (FLG) null mutations are positively associated with nickel sensitization. We have hypothesized that histidine-rich filaggrin proteins in the epidermis chelate nickel ions and prevent their skin penetration and exposure to Langerhans cells. Furthermore, we have proposed that the low degree of genetic predisposition to nickel sensitization found by a Danish twin study was explained by a high prevalence of ear piercing among participants resulting in 'bypassing' of the filaggrin proteins.
OriginalsprogEngelsk
TidsskriftBritish Journal of Dermatology
Vol/bind162
Udgave nummer6
Sider (fra-til)1278-85
Antal sider8
ISSN0007-0963
DOI
StatusUdgivet - 1 jun. 2010

ID: 34093853