Standard
Note: Simple means for selective removal of the 365 nm line from the Hg spectrum using Dy. / Vesborg, P. C. K.; Chorkendorff, I.; Brock-Nannestad, Theis; Dethlefsen, Johannes Rytter; Bendix, Jesper.
I:
Review of Scientific Instruments, Bind 82, 2011.
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
Harvard
Vesborg, PCK, Chorkendorff, I, Brock-Nannestad, T, Dethlefsen, JR & Bendix, J 2011, 'Note: Simple means for selective removal of the 365 nm line from the Hg spectrum using Dy', Review of Scientific Instruments, bind 82.
APA
Vesborg, P. C. K., Chorkendorff, I., Brock-Nannestad, T., Dethlefsen, J. R., & Bendix, J. (2011). Note: Simple means for selective removal of the 365 nm line from the Hg spectrum using Dy. Review of Scientific Instruments, 82.
Vancouver
Vesborg PCK, Chorkendorff I, Brock-Nannestad T, Dethlefsen JR, Bendix J. Note: Simple means for selective removal of the 365 nm line from the Hg spectrum using Dy. Review of Scientific Instruments. 2011;82.
Author
Vesborg, P. C. K. ; Chorkendorff, I. ; Brock-Nannestad, Theis ; Dethlefsen, Johannes Rytter ; Bendix, Jesper. / Note: Simple means for selective removal of the 365 nm line from the Hg spectrum using Dy. I: Review of Scientific Instruments. 2011 ; Bind 82.
Bibtex
@article{b96b23e630e9466bb21a61e446206914,
title = "Note: Simple means for selective removal of the 365 nm line from the Hg spectrum using Dy",
author = "Vesborg, {P. C. K.} and I. Chorkendorff and Theis Brock-Nannestad and Dethlefsen, {Johannes Rytter} and Jesper Bendix",
year = "2011",
language = "English",
volume = "82",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics",
}
RIS
TY - JOUR
T1 - Note: Simple means for selective removal of the 365 nm line from the Hg spectrum using Dy
AU - Vesborg, P. C. K.
AU - Chorkendorff, I.
AU - Brock-Nannestad, Theis
AU - Dethlefsen, Johannes Rytter
AU - Bendix, Jesper
PY - 2011
Y1 - 2011
M3 - Journal article
VL - 82
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
SN - 0034-6748
ER -
