Specific Academic Learning and Exam Self-Efficacy: Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method
Research output: Contribution to conference › Conference abstract for conference › Research › peer-review
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Specific Academic Learning and Exam Self-Efficacy : Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method. / Nielsen, Tine; Dammeyer, Jesper; Makransky, Guido.
2016. Abstract from Higher Education Conference 2016, Amsterdam, Netherlands.Research output: Contribution to conference › Conference abstract for conference › Research › peer-review
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TY - ABST
T1 - Specific Academic Learning and Exam Self-Efficacy
T2 - Higher Education Conference 2016
AU - Nielsen, Tine
AU - Dammeyer, Jesper
AU - Makransky, Guido
N1 - page 117 of the proceedings for the HEC 2016 conference
PY - 2016/6
Y1 - 2016/6
M3 - Conference abstract for conference
Y2 - 13 July 2016 through 15 July 2016
ER -
ID: 164455176