McXtrace: a Monte Carlo software package for simulation of X-ray optics, beamlines, and experiments
Research output: Contribution to journal › Journal article › Research › peer-review
Original language | English |
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Journal | Journal of Applied Crystallography |
Volume | 46 |
Issue number | Part 3 |
Pages (from-to) | 679-696 |
Number of pages | 18 |
ISSN | 0021-8898 |
DOIs | |
Publication status | Published - 1 Jun 2013 |
ID: 57847516