Characterizing molecular junctions through the mechanically controlled break-junction approach
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Characterizing molecular junctions through the mechanically controlled break-junction approach. / Xu, Bingqian; Hamill, Joseph; Wang, Kun.
In: Reports in Electrochemistry, 31.05.2014, p. 1.Research output: Contribution to journal › Review › Research › peer-review
Harvard
Xu, B, Hamill, J & Wang, K 2014, 'Characterizing molecular junctions through the mechanically controlled break-junction approach', Reports in Electrochemistry, pp. 1. https://doi.org/10.2147/RIE.S46629
APA
Xu, B., Hamill, J., & Wang, K. (2014). Characterizing molecular junctions through the mechanically controlled break-junction approach. Reports in Electrochemistry, 1. https://doi.org/10.2147/RIE.S46629
Vancouver
Xu B, Hamill J, Wang K. Characterizing molecular junctions through the mechanically controlled break-junction approach. Reports in Electrochemistry. 2014 May 31;1. https://doi.org/10.2147/RIE.S46629
Author
Bibtex
@article{c6e8572ec8df41a58104f10fc1417943,
title = "Characterizing molecular junctions through the mechanically controlled break-junction approach",
author = "Bingqian Xu and Joseph Hamill and Kun Wang",
year = "2014",
month = may,
day = "31",
doi = "10.2147/RIE.S46629",
language = "English",
pages = "1",
journal = "Reports in Electrochemistry",
issn = "2230-4096",
publisher = "Taylor & Francis",
}
RIS
TY - JOUR
T1 - Characterizing molecular junctions through the mechanically controlled break-junction approach
AU - Xu, Bingqian
AU - Hamill, Joseph
AU - Wang, Kun
PY - 2014/5/31
Y1 - 2014/5/31
U2 - 10.2147/RIE.S46629
DO - 10.2147/RIE.S46629
M3 - Review
SP - 1
JO - Reports in Electrochemistry
JF - Reports in Electrochemistry
SN - 2230-4096
ER -
ID: 383314797