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Spectral correction algorithm for multispectral CdTe x-ray detectors. / Christensen, Erik D.; Kehres, Jan; Gu, Yun; Feidenhans'l, Robert Krarup; Olsen, Ulrik Lund.
I:
Proceedings of SPIE, Bind 10393, 103930H, 07.09.2017.
Publikation: Bidrag til tidsskrift › Konferenceartikel › Forskning › fagfællebedømt
Harvard
Christensen, ED, Kehres, J, Gu, Y, Feidenhans'l, RK & Olsen, UL 2017, '
Spectral correction algorithm for multispectral CdTe x-ray detectors',
Proceedings of SPIE, bind 10393, 103930H.
https://doi.org/10.1117/12.2272935APA
Christensen, E. D., Kehres, J., Gu, Y., Feidenhans'l, R. K., & Olsen, U. L. (2017).
Spectral correction algorithm for multispectral CdTe x-ray detectors.
Proceedings of SPIE,
10393, [103930H].
https://doi.org/10.1117/12.2272935Vancouver
Christensen ED, Kehres J, Gu Y, Feidenhans'l RK, Olsen UL.
Spectral correction algorithm for multispectral CdTe x-ray detectors.
Proceedings of SPIE. 2017 sep. 7;10393. 103930H.
https://doi.org/10.1117/12.2272935Author
Christensen, Erik D. ; Kehres, Jan ; Gu, Yun ; Feidenhans'l, Robert Krarup ; Olsen, Ulrik Lund. / Spectral correction algorithm for multispectral CdTe x-ray detectors. I: Proceedings of SPIE. 2017 ; Bind 10393.
Bibtex
@inproceedings{2ef27ff78a3f43189b23d939dc662801,
title = "Spectral correction algorithm for multispectral CdTe x-ray detectors",
author = "Christensen, {Erik D.} and Jan Kehres and Yun Gu and Feidenhans'l, {Robert Krarup} and Olsen, {Ulrik Lund}",
year = "2017",
month = sep,
day = "7",
doi = "10.1117/12.2272935",
language = "English",
volume = "10393",
journal = "Proceedings of S P I E - International Society for Optical Engineering",
issn = "0277-786X",
publisher = "International Society for Optical Engineering",
}
RIS
TY - GEN
T1 - Spectral correction algorithm for multispectral CdTe x-ray detectors
AU - Christensen, Erik D.
AU - Kehres, Jan
AU - Gu, Yun
AU - Feidenhans'l, Robert Krarup
AU - Olsen, Ulrik Lund
PY - 2017/9/7
Y1 - 2017/9/7
U2 - 10.1117/12.2272935
DO - 10.1117/12.2272935
M3 - Conference article
VL - 10393
JO - Proceedings of S P I E - International Society for Optical Engineering
JF - Proceedings of S P I E - International Society for Optical Engineering
SN - 0277-786X
M1 - 103930H
ER -
