Advanced Structural Characterization of Organic Thin Films
Publikation: Bog/antologi/afhandling/rapport › Ph.d.-afhandling › Forskning
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Advanced Structural Characterization of Organic Thin Films. / Gu, Yun.
The Niels Bohr Institute, Faculty of Science, University of Copenhagen, 2013. 108 s.Publikation: Bog/antologi/afhandling/rapport › Ph.d.-afhandling › Forskning
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TY - BOOK
T1 - Advanced Structural Characterization of Organic Thin Films
AU - Gu, Yun
PY - 2013
Y1 - 2013
N2 - In this thesis, the structural characterizations of three organic film systems are described. Several X-ray based techniques have been utilized for the characterizations for different research goals.The structures of N,N',N-trioctyltriazatriangulenium (Oct3-TATA+) salts havebeen investigated by optical, surface and X-ray method. We describe the production of Langmuir-Blodgett film and how the absorption spectroscopy is a powerful tool to identify layer of monomer and dimer. X-ray refelctometry has been applied as a method for the study of the multilayer film and interface structure.A separation of small molecule and polymer layers is indicated by Flory-Huggins theory for the triisopropylsilylethynl pentacene (TIPS-PEN) and polystyrene blend films. In order to investigate the phase separated layers in the ink-jet printed films, we propose a method to measure diraction Bragg peaks by X-ray standing waves. A preliminary experiment has been shown and the results imply a three-layer TIPS-PEN/PS/TIPS-PEN segregated film.In the last part of the thesis, the time-resolved X-ray diffraction is applied to the study ferroelectric capacitors of copolymer(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)). The early stage result shows a periodic lattice deformation in direction parallel to the electric field following the driving electric field. The timeresolved X-ray diffraction can be employed to investigate the crystal deformations of switching capacitor dynamically and hysteresis properties simultaneously.
AB - In this thesis, the structural characterizations of three organic film systems are described. Several X-ray based techniques have been utilized for the characterizations for different research goals.The structures of N,N',N-trioctyltriazatriangulenium (Oct3-TATA+) salts havebeen investigated by optical, surface and X-ray method. We describe the production of Langmuir-Blodgett film and how the absorption spectroscopy is a powerful tool to identify layer of monomer and dimer. X-ray refelctometry has been applied as a method for the study of the multilayer film and interface structure.A separation of small molecule and polymer layers is indicated by Flory-Huggins theory for the triisopropylsilylethynl pentacene (TIPS-PEN) and polystyrene blend films. In order to investigate the phase separated layers in the ink-jet printed films, we propose a method to measure diraction Bragg peaks by X-ray standing waves. A preliminary experiment has been shown and the results imply a three-layer TIPS-PEN/PS/TIPS-PEN segregated film.In the last part of the thesis, the time-resolved X-ray diffraction is applied to the study ferroelectric capacitors of copolymer(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)). The early stage result shows a periodic lattice deformation in direction parallel to the electric field following the driving electric field. The timeresolved X-ray diffraction can be employed to investigate the crystal deformations of switching capacitor dynamically and hysteresis properties simultaneously.
UR - https://soeg.kb.dk/permalink/45KBDK_KGL/fbp0ps/alma99122777337205763
M3 - Ph.D. thesis
BT - Advanced Structural Characterization of Organic Thin Films
PB - The Niels Bohr Institute, Faculty of Science, University of Copenhagen
ER -
ID: 98163986