Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time

Research output: Contribution to journalJournal articleResearchpeer-review

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Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time. / Thakuria, Ranjit; Eddleston, Mark D.; Chow, Ernest H. H.; Lloyd, Gareth O.; Aldous, Barry J.; Krzyzaniak, Joseph F.; Bond, Andrew; Jones, William.

In: Angewandte Chemie International Edition, Vol. 52, No. 40, 27.09.2013, p. 10541-10544.

Research output: Contribution to journalJournal articleResearchpeer-review

Harvard

Thakuria, R, Eddleston, MD, Chow, EHH, Lloyd, GO, Aldous, BJ, Krzyzaniak, JF, Bond, A & Jones, W 2013, 'Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time', Angewandte Chemie International Edition, vol. 52, no. 40, pp. 10541-10544. https://doi.org/10.1002/anie.201302532

APA

Thakuria, R., Eddleston, M. D., Chow, E. H. H., Lloyd, G. O., Aldous, B. J., Krzyzaniak, J. F., Bond, A., & Jones, W. (2013). Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time. Angewandte Chemie International Edition, 52(40), 10541-10544. https://doi.org/10.1002/anie.201302532

Vancouver

Thakuria R, Eddleston MD, Chow EHH, Lloyd GO, Aldous BJ, Krzyzaniak JF et al. Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time. Angewandte Chemie International Edition. 2013 Sep 27;52(40):10541-10544. https://doi.org/10.1002/anie.201302532

Author

Thakuria, Ranjit ; Eddleston, Mark D. ; Chow, Ernest H. H. ; Lloyd, Gareth O. ; Aldous, Barry J. ; Krzyzaniak, Joseph F. ; Bond, Andrew ; Jones, William. / Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time. In: Angewandte Chemie International Edition. 2013 ; Vol. 52, No. 40. pp. 10541-10544.

Bibtex

@article{ce17064288eb47bca212865556039325,
title = "Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time",
keywords = "atomic force microscopy, cocrystals, phase transitions, polymorphism, surface analysis",
author = "Ranjit Thakuria and Eddleston, {Mark D.} and Chow, {Ernest H. H.} and Lloyd, {Gareth O.} and Aldous, {Barry J.} and Krzyzaniak, {Joseph F.} and Andrew Bond and William Jones",
year = "2013",
month = sep,
day = "27",
doi = "10.1002/anie.201302532",
language = "English",
volume = "52",
pages = "10541--10544",
journal = "Angewandte Chemie International Edition",
issn = "1433-7851",
publisher = "Wiley-VCH Verlag GmbH & Co. KGaA",
number = "40",

}

RIS

TY - JOUR

T1 - Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time

AU - Thakuria, Ranjit

AU - Eddleston, Mark D.

AU - Chow, Ernest H. H.

AU - Lloyd, Gareth O.

AU - Aldous, Barry J.

AU - Krzyzaniak, Joseph F.

AU - Bond, Andrew

AU - Jones, William

PY - 2013/9/27

Y1 - 2013/9/27

KW - atomic force microscopy

KW - cocrystals

KW - phase transitions

KW - polymorphism

KW - surface analysis

U2 - 10.1002/anie.201302532

DO - 10.1002/anie.201302532

M3 - Journal article

C2 - 23955996

VL - 52

SP - 10541

EP - 10544

JO - Angewandte Chemie International Edition

JF - Angewandte Chemie International Edition

SN - 1433-7851

IS - 40

ER -

ID: 101855547