Metric learning by directly minimizing the k-NN training error
Publikation: Bidrag til bog/antologi/rapport › Konferencebidrag i proceedings › Forskning › fagfællebedømt
| Originalsprog | Engelsk |
|---|---|
| Titel | 2012 21st International Conference on Pattern Recognition (ICPR) |
| Antal sider | 4 |
| Forlag | IEEE |
| Publikationsdato | 2012 |
| Sider | 1265-1268 |
| ISBN (Trykt) | 978-1-4673-2216-4 |
| Status | Udgivet - 2012 |
| Begivenhed | 21st International Conference on Pattern Recognition - Tsukuba Science City , Japan Varighed: 11 nov. 2012 → 15 nov. 2012 Konferencens nummer: 21 |
Konference
| Konference | 21st International Conference on Pattern Recognition |
|---|---|
| Nummer | 21 |
| Land | Japan |
| By | Tsukuba Science City |
| Periode | 11/11/2012 → 15/11/2012 |
- learning (artificial intelligence), LOO error minimization, energy function, global distance metrics, k-NN training error minimization, leave-one-out error minimization, metric learning, public datasets, Art, Iris, Machine learning, Measurement, Optimization, Training, Vectors
Forskningsområder
ID: 46940283