Standard
Correlation between Electrical Transport and Nanoscale Strain in InAs/In06Ga04As Core-Shell Nanowires. / Zeng, Lunjie; Gammer, Christoph; Ozdol, Burak; Nordqvist, Thomas; Nygard, Jesper; Krogstrup, Peter; Minor, Andrew M.; Jaeger, Wolfgang; Olsson, Eva.
I:
Nano Letters, Bind 18, Nr. 8, 25.07.2018, s. 4949-4956.
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
Harvard
Zeng, L, Gammer, C, Ozdol, B
, Nordqvist, T, Nygard, J, Krogstrup, P, Minor, AM, Jaeger, W & Olsson, E 2018, '
Correlation between Electrical Transport and Nanoscale Strain in InAs/In06Ga04As Core-Shell Nanowires',
Nano Letters, bind 18, nr. 8, s. 4949-4956.
https://doi.org/10.1021/acs.nanolett.8b01782APA
Zeng, L., Gammer, C., Ozdol, B.
, Nordqvist, T., Nygard, J., Krogstrup, P., Minor, A. M., Jaeger, W., & Olsson, E. (2018).
Correlation between Electrical Transport and Nanoscale Strain in InAs/In06Ga04As Core-Shell Nanowires.
Nano Letters,
18(8), 4949-4956.
https://doi.org/10.1021/acs.nanolett.8b01782Vancouver
Zeng L, Gammer C, Ozdol B
, Nordqvist T, Nygard J, Krogstrup P o.a.
Correlation between Electrical Transport and Nanoscale Strain in InAs/In06Ga04As Core-Shell Nanowires.
Nano Letters. 2018 jul. 25;18(8):4949-4956.
https://doi.org/10.1021/acs.nanolett.8b01782Author
Zeng, Lunjie ; Gammer, Christoph ; Ozdol, Burak ; Nordqvist, Thomas ; Nygard, Jesper ; Krogstrup, Peter ; Minor, Andrew M. ; Jaeger, Wolfgang ; Olsson, Eva. / Correlation between Electrical Transport and Nanoscale Strain in InAs/In06Ga04As Core-Shell Nanowires. I: Nano Letters. 2018 ; Bind 18, Nr. 8. s. 4949-4956.
Bibtex
@article{a13c0fb1fb61493f81cd523bbcf59e3b,
title = "Correlation between Electrical Transport and Nanoscale Strain in InAs/In06Ga04As Core-Shell Nanowires",
keywords = "InAs nanowire, strain mapping, piezoresistance, transmission electron microscopy",
author = "Lunjie Zeng and Christoph Gammer and Burak Ozdol and Thomas Nordqvist and Jesper Nygard and Peter Krogstrup and Minor, {Andrew M.} and Wolfgang Jaeger and Eva Olsson",
note = "[Qdev]",
year = "2018",
month = jul,
day = "25",
doi = "10.1021/acs.nanolett.8b01782",
language = "English",
volume = "18",
pages = "4949--4956",
journal = "Nano Letters",
issn = "1530-6984",
publisher = "American Chemical Society",
number = "8",
}
RIS
TY - JOUR
T1 - Correlation between Electrical Transport and Nanoscale Strain in InAs/In06Ga04As Core-Shell Nanowires
AU - Zeng, Lunjie
AU - Gammer, Christoph
AU - Ozdol, Burak
AU - Nordqvist, Thomas
AU - Nygard, Jesper
AU - Krogstrup, Peter
AU - Minor, Andrew M.
AU - Jaeger, Wolfgang
AU - Olsson, Eva
N1 - [Qdev]
PY - 2018/7/25
Y1 - 2018/7/25
KW - InAs nanowire
KW - strain mapping
KW - piezoresistance
KW - transmission electron microscopy
U2 - 10.1021/acs.nanolett.8b01782
DO - 10.1021/acs.nanolett.8b01782
M3 - Journal article
C2 - 30044917
VL - 18
SP - 4949
EP - 4956
JO - Nano Letters
JF - Nano Letters
SN - 1530-6984
IS - 8
ER -
