Measurement of high-quality diffraction data with a Nonius KappaCCD diffractometer: finding the optimal experimental parameters

Research output: Contribution to journalJournal articleResearchpeer-review

Henning Osholm Sørensen, Sine Larsen

Original languageEnglish
JournalJournal of Applied Crystallography
Issue number36
Pages (from-to)931-939
ISSN0021-8898
Publication statusPublished - 2003

ID: 124819